JTAG/Boundary Scan Tool “Scan Assist” voted to win distinguished international award
GOEPEL electronic announces that it has won the “Best in Test Award” for the third time in a row. The award is sponsored by the international magazine and website Test & Measurement World. GOEPEL electronic applied for the award with its software tool “Scan Assist” and was rewarded for JTAG/Boundary Scan innovation.
“We are very proud to have repeatedly won the Best in Test Award for our revolutionary JTAG/Boundary Scan solutions”, says Thomas Wenzel, Managing Director of GOEPEL electronic’s Boundary Scan division. “It is our goal to continuously develop technologically leading platform solutions in hardware as well as software. To be awarded again is also an approval, in our opinion, for the continued quality level we strive to maintain.”
According to GOEPEL, Scan Assist enables the real-time activation and analysis of individually defined logic states directly in the target hardware (Pin/Net Toggler) without prior test program generation. It automatically identifies potentially unsafe or hardware harming vectors as well as logic states of non-Boundary Scan nets and pins (cluster logic).
