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System Cascon • Enhances the interaction between boundary scan tools in flying probe testers • New control algorithm implemented in all Automatic Test Program Generation (ATPG) tools and Pin Fault Diagnostic (PFD) processors • Probes can be used for cluster tests or manually created tests • Detected faults are diagnosed after test execution by means of intelligent Pin Fault Diagnostic processors • Able to repeat a particular test step in case of a detected fault without impairing the quality of diagnostics, with the number of repetitions being definable by the user GOEPEL electronic GmbH
www.goepel.com | 
