Olympus LEXT is a confocal laser scanning microscope for ultra-precise measurement and observation with a high level of reliability. Vacuum pumpdown or sample preparation is not required and samples can be placed directly on the microscope stage as they are. Both 3D observation and high precision 3D measurement are possible in real time. Olympus LEXT is well suited for the ultra-fine surface observation and measurements required for micro fabrication devices like MEMS, for new materials development, and for today’s thinner devices, with more compact surface mounting requirements. Xmicro Solution
Booth number: S12 | 
