JTAG Technologies Wins Boundary Scan Best-in-Test Award

JTAG Technologies has been selected by Test and Measurement World (TMW) as the winner in the boundary scan category of the Best-in-Test program for 2008. TMW's Best-in-Test judges select among innovative and beneficial products in several categories, placing JTAG Technologies' Rack-Mountable Instrument (RMI) at the top of the highly competitive boundary scan category. The award was presented at the recent APEX show in Las Vegas, USA.

Peter van den Eijnden, President of JTAG Technologies, commented, "We wanted to be able to give our users a convenient way to combine their boundary scan operations with functional testing. The RMI meets the need perfectly, and we're very gratified to receive this recognition from Test and Measurement World."

www.jtag.com