Nordson YESTECH to Debut Upgraded Software at APEX 2010

Nordson YESTECH announces it will showcase the newly upgraded YESPC software and feature their FX series AOI and advanced technology 3D x-ray inspection solutions for populated printed circuit boards at this years’ APEX Printed Circuits Expo in Las Vegas, Nevada, USA from April 6-8. Live demonstrations will be held in the company's booth with their complete line of AOI and x-ray systems, showcasing the new features of the upgraded YESPC software.

Nordson YESTECH said its YESPC software is a web-based SPC (statistical process control) tool that can be utilized for both real-time and historical charts and inspection reports. When utilized in real-time mode, YESPC enables engineers to focus on defect prevention by monitoring for unwanted trends in the manufacturing process. User selectable "chart windows” can be configured to show defect paretos, yield trends, machine utilization, as well as X-Y positional and Cp/Cpk data. The latest version of YESPC now includes enhanced functionality in pareto charts that allows the user to drill down to defect and false call images. The latest upgrade of YESPC software maximizes the capabilities of Nordson YESTECH’s line of inspection solutions, the company said.

"We are very pleased to be showcasing our new inspection solutions and upgraded YESPC software and at this years APEX show,” said Don Miller, Nordson YESTECH President. "Our YESPC software truly maximizes the capabilities of our inspection solutions, offering customers a powerful and easy to use process control tool.”

www.nordsonyestech.com