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| News, T&M/Inspection - 07 Apr 2008 |
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| Nordson Corporation has announced the appointment of Steven Kew as Chief Executive of its subsidiary Dage Holdings, effective April 1. Kew replaces retiring Dage Chief Executive Geraint Rees. Prior to... |
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| News, T&M/Inspection - 04 Apr 2008 |
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| The International Electronics Manufacturing Initiative (iNEMI), an industry-led consortium focused on identifying and closing technology gaps, is organizing several new efforts to help industry collab... |
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| Top News, T&M/Inspection - 04 Apr 2008 |
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| The International Electronics Manufacturing Initiative (iNEMI), an industry-led consortium focused on identifying and closing technology gaps, is organizing several new efforts to help industry collab... |
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| News, T&M/Inspection - 04 Apr 2008 |
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| GOEPEL electronic and Texmac announce that they have demonstrated a successful integration of GOEPEL's CASCON GALAXY software and SCANFLEX hardware into the Takaya APT-9411 flying-probe system at the ... |
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| Manufacturing Products & Equipment, T&M/Inspection - Apr 2008 |
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| Revolution • Enhanced viewing capabilities with added Quad View facility and dual LCD monitors • Quad View facility allows 4 images to be displayed at once which enables a more thorough inspection of... |
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| Manufacturing Products & Equipment, T&M/Inspection - Apr 2008 |
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| Flex Ultra HR • 5.0 megapixel camera technology allowing for inspection of 01005 components • Suitable for inspection in assembly lines producing memory, notebook PCBs, mobile phones and automotive e... |
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| Manufacturing Products & Equipment, T&M/Inspection - Apr 2008 |
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| System Cascon • Enhances the interaction between boundary scan tools in flying probe testers • New control algorithm implemented in all Automatic Test Program Generation (ATPG) tools and Pin Fault Di... |
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| Manufacturing Products & Equipment, T&M/Inspection - Apr 2008 |
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| LeadTracer-RoHS • Accurately identifies all solder alloys within minutes • Performs “solder pot” analysis allowing users to track “changes” in their process • Addresses various potential “weak links” ... |
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| Manufacturing Products & Equipment, T&M/Inspection - Apr 2008 |
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| MX2000IR • For inspecting medium and large lots in semiconductor manufacture • Application scope includes MEMS, wafer bonds and flip chips, as well as photovoltaic products • Wafers are loaded for ins... |
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| News, T&M/Inspection - 26 Mar 2008 |
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| FCT Assembly (FCTA) announces the acquisition of a Spark OES Analyzer (Optical Emission Spectroscopy) to its analytical lab, which is located in Greeley, Colo., USA. According to FCTA, the OES analyze... |
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